A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• (SiO2 (500 nm)/Si(111)) at different beam currents In order to obtain complementary information on the structures deposited with different beam currents, noncontact AFM was used to investigate the height of the deposits and their particle size. Figure 4a and Figure 4b depict the 2D AFM images and

Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

• Zhao Liu,
• Antoine Hinaut,
• Stefan Peeters,
• Sebastian Scherb,
• Ernst Meyer,
• Maria Clelia Righi and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2021, 12, 432–439, doi:10.3762/bjnano.12.35

• K). Atomic force microscopy Experiments were performed by using a custom-built UHV AFM microscope operating at room temperature and a base pressure of 5 × 10−11 mbar. All images were scanned with silicon cantilevers equipped with sharp tips (PPP-NCL, Nanosensors) running in noncontact AFM mode with

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• measurements are easier to implement, since no additional sample preparation is necessary [20]. There is a number of AFM-based methods, such as tip-enhanced Raman spectroscopy (TERS) [21], AFM-based infrared spectroscopy (AFM-IR) [16][22], noncontact AFM (ncAFM ) [23][24], chemical AFM (cAFM) [25][26], and

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• the chosen approach for pp-KPFM are finally discussed. pp-KPFM Implementation The experiments were performed on the basis of noncontact AFM (nc-AFM) under ultrahigh vacuum (UHV) with a beam deflection setup operated in frequency-modulation (FM) mode at room temperature. In the following, we only

• -based devices, hybrid perovskite thin films and single crystals as well as type-II van der Waals heterojunctions based on transition metal dichalcogenides. Experimental Nc-AFM and pp-KPFM Noncontact-AFM (nc-AFM) experiments were performed with a ScientaOmicron VT-AFM setup in UHV at room temperature (RT

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• cleaved with a scalpel just before being introduced in the load-lock of the VT-AFM (after cleavage, the sample thickness was estimated to be on the order of 1 mm). Noncontact AFM and Kelvin probe force microscopy The nc-AFM experiments were carried out with an Omicron VT-AFM setup in ultrahigh vacuum (UHV

• desirable to nullify (or a least minimize) the electrostatic forces by using an active KPFM compensation potential loop. In this work, the photovoltaic and optomechanical properties of a methylammonium lead tribromide (CH3NH3PbBr3, also referred to as MAPbBr3) single crystal are investigated by noncontact

• AFM (nc-AFM) combined with KPFM. MAPbBr3 has been selected for these experiments since its absorption band edge [12] falls well below the wavelength of the AFM light source (840 nm for the Omicron VT-AFM setup used here). A specific protocol allowing simultaneous recording of the spectroscopic curves

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• studied with scanning tunneling microscopy (STM) to evaluate the surface conformation and molecular geometry [14]. Individual molecules of nonplanar freebase and copper-metallated tetraphenyl porphyrins adsorbed on Cu(111) were investigated using frequency modulated noncontact AFM to resolve subtle

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

• Benjamin Grévin,
• Pierre-Olivier Schwartz,
• Laure Biniek,
• Martin Brinkmann,
• Nicolas Leclerc,
• Elena Zaborova and
• Stéphane Méry

Beilstein J. Nanotechnol. 2016, 7, 799–808, doi:10.3762/bjnano.7.71

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• MEMS benchmark f0Q and a merit factor f0Q/k found by Albrecht [3] for the minimum detectable force by noncontact AFM. If the noise PSD is dominated by detector noise, Equation 40, then we obtain a merit factor MS instead of Equation 45: similarly as above, D0 is a fraction of z and hence Using Equation

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• can be achieved with noncontact AFM allows for a quantitative detection of dissipation that involves the formation and the breakage of weak intermolecular bonds in an organic molecule [106]. However, for many practical cases, the separation entails energy dissipation in the bulk material – generally a

Optimal geometry for a quartz multipurpose SPM sensor

• Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

• microscopes (AFM) and lateral force microscopes (LFM), however, the sensor is more complex. The atomically sharp probe must be combined with a force sensor, usually a cantilever, with either piezoelectric or optical deflection detection. For noncontact AFM (NC-AFM) and dynamic LFM (DLFM), where the sensor is

Selective surface modification of lithographic silicon oxide nanostructures by organofunctional silanes

• Thomas Baumgärtel,
• Christian von Borczyskowski and
• Harald Graaf

Beilstein J. Nanotechnol. 2013, 4, 218–226, doi:10.3762/bjnano.4.22

• topography depends strongly on these parameters for noncontact AFM operation. Binding of OTS and 11-bromoundecyltrichlorosilane (both ABCR, Germany) was carried out by immersion of the structures into a 10 mM solution of the silane in toluene (spectroscopic grade, Merck, Germany). After a specific amount of

Effect of normal load and roughness on the nanoscale friction coefficient in the elastic and plastic contact regime

• Aditya Kumar,
• Thorsten Staedler and
• Xin Jiang

Beilstein J. Nanotechnol. 2013, 4, 66–71, doi:10.3762/bjnano.4.7

• vapor deposition (Balzer BAS 450) utilizing a gas mixture of argon and acetylene at a bias voltage of −950 and −350 V, respectively. Topographical characterization: The surface morphology was characterized by atomic force microscopy (AFM, Park Systems Corp. XE-100). Noncontact AFM was used to obtain

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

• configuration is given by Hooke’s law F = −kz, with the spring constant k and the deflection z. For the experiment, the TFs are glued to a holder in exactly the same way as for the low-temperature noncontact AFM developed in our group [25]. To apply a force on the TF a loop is formed by a thin wire, which is

Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

• Miriam Jaafar,
• David Martínez-Martín,
• Mariano Cuenca,
• John Melcher,
• Arvind Raman and
• Julio Gómez-Herrero

Beilstein J. Nanotechnol. 2012, 3, 336–344, doi:10.3762/bjnano.3.38

• high quality factor Q of the cantilevers in vacuum, which present a settling time given by τcl= Q/(πf0). Frequency-modulation AFM (FM-AFM, also known as noncontact AFM) [9] is the classical alternative to AM allowing atomic resolution in UHV chambers [10] at higher scanning rates. FM-AFM has recently

Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation

• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33

• disciplines, but it is not widespread in the context of noncontact AFM. This may be due to the absence of discussions of the practical and technical aspects of wavelet analysis relating to noncontact AFM. This article shows the use of wavelet cross-correlation by means of two simple but paradigmatic examples

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

• Adam Sweetman,
• Sam Jarvis,
• Rosanna Danza and
• Philip Moriarty

Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3

• ; noncontact AFM; qPlus; Si(001); Si(100); tip (apex) structure; Introduction It is now generally accepted that atomic resolution in NC-AFM imaging on semiconducting surfaces is due to the chemical force between the atoms of the surface and the last few atoms of the tip apex [1][2][3][4]. Even with well